23.5% Peak
Efficiency.
Guaranteed 25 Years.

From Installation to 25 Years of Generation

The Stack That Powers Tomorrow

Helios modules are validated under IEC 61215 extended stress tests: 1,000 hours damp-heat, UV exposure, thermal cycling, and potential-induced degradation (PID) screening. N-Type TOPCon cells show <0.4% annual degradation over 25 years.

• Bifacial Albedo Gain: +8–25% Output

  Ground-reflected irradiance captured by rear glass under IEC 60904-1-1

• Anti-PID Glass Encapsulation

  No degradation at high system voltages, safe for 1500V string architecture

• BMS Cell-Level Monitoring

  ±0.5% SOC accuracy; auto-balancing; over-temperature, over-current protection